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APA Citation
Bingkai, L., Yudong, L., Lin, W., Dong, Z., Jie, F., Xiang, Z., Yulong, C., Jing, F., & Qi, G. (2021). analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside‐Illuminated CMOS Image Sensors. Chinese journal of electronics, 30(1), 180–184. http://access.bl.uk/ark:/81055/vdc_100124362707.0x00004a