Cite
HARVARD Citation
Bingkai, L. et al. (2021). Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside‐Illuminated CMOS Image Sensors. Chinese journal of electronics. 30 (1), pp. 180-184. [Online].
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Bingkai, L. et al. (2021). Analysis of Dark Signal Degradation Caused by 1 MeV Neutron Irradiation on Backside‐Illuminated CMOS Image Sensors. Chinese journal of electronics. 30 (1), pp. 180-184. [Online].