Cite
HARVARD Citation
Ritter, P. et al. (2017). Full 4‐port deembedding of differential transmission line interfaces by 2‐port reflection measurements with mode conversion excitation. Electronics letters. 53 (8), pp. 526-528. [Online].
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Ritter, P. et al. (2017). Full 4‐port deembedding of differential transmission line interfaces by 2‐port reflection measurements with mode conversion excitation. Electronics letters. 53 (8), pp. 526-528. [Online].