Full 4‐port deembedding of differential transmission line interfaces by 2‐port reflection measurements with mode conversion excitation. Issue 8 (1st April 2017)

• Record Type: Journal Article
• Authors: Ritter, P.; Möller, M.
• Is Part Of: Electronics letters. Volume 53:Issue 8(2017)
• Page Start: 526
• Page End: 528
• Publication Date: 2017-04-01
• Subjects: transmission lines -- electronics packaging -- electric connectors -- matrix algebra; full 4‐port deembedding -- differential transmission line interfaces -- 2‐port reflection measurements -- mode conversion excitation -- 4×4 transmission matrix -- microchip fixture -- calibration structure -- on‐chip termination -- mixed mode parameter form -- connectors -- chip performance -- resistance 50 ohm; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2016.4471
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : An approach is presented for the determination of the 4 × 4 transmission matrix of differential transmission line interfaces on a microchip fixture. Different settings of a simple calibration structure that extends the already available 50‐Ω on‐chip termination excite different transmission modes, which are used for the determination of the transmission matrix in mixed mode parameter form. Only reflection measurements at the two easily accessible connectors of the fixture are required, which enables an in‐situ deembedding of the chip performance while mounted.