Cite
APA Citation
Li, X., Li, C., Xu, Z., Li, Y., Yang, Y., Hu, H., Jiang, Z., Wang, J., Ren, J., Zheng, C., Lu, C., & Wen, Z. (2021). ferroelectric Properties and Polarization Fatigue of La:HfO2 Thin‐Film Capacitors. Physica status solidi, 15(4), n/a. http://access.bl.uk/ark:/81055/vdc_100127440846.0x000011