Cite
HARVARD Citation
Li, X. et al. (2021). Ferroelectric Properties and Polarization Fatigue of La:HfO2 Thin‐Film Capacitors. Physica status solidi. 15 (4), p. n/a. [Online].
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Li, X. et al. (2021). Ferroelectric Properties and Polarization Fatigue of La:HfO2 Thin‐Film Capacitors. Physica status solidi. 15 (4), p. n/a. [Online].