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APA Citation
Fabbro, R., Haber, T., Fasching, G., Coppeta, R., Pusterhofer, M., & Grogger, W. (2021). defect localization in high-power vertical cavity surface emitting laser arrays by means of reverse biased emission microscopy. Measurement science & technology, 32, . http://access.bl.uk/ark:/81055/vdc_100125042466.0x000043