How to solve problems in micro- and nanofabrication caused by the emission of electrons and charged metal atoms during e-beam evaporation. (9th March 2021)
- Record Type:
- Journal Article
- Title:
- How to solve problems in micro- and nanofabrication caused by the emission of electrons and charged metal atoms during e-beam evaporation. (9th March 2021)
- Main Title:
- How to solve problems in micro- and nanofabrication caused by the emission of electrons and charged metal atoms during e-beam evaporation
- Authors:
- Volmer, Frank
Seidler, Inga
Bisswanger, Timo
Tu, Jhih-Sian
Schreiber, Lars R
Stampfer, Christoph
Beschoten, Bernd - Abstract:
- Abstract: We discuss how the emission of electrons and ions during electron-beam-induced physical vapor deposition can cause problems in micro- and nanofabrication processes. After giving a short overview of different types of radiation emitted from an electron-beam (e-beam) evaporator and how the amount of radiation depends on different deposition parameters and conditions, we highlight two phenomena in more detail: First, we discuss an unintentional shadow evaporation beneath the undercut of a resist layer caused by the one part of the metal vapor which got ionized by electron-impact ionization. These ions first lead to an unintentional build-up of charges on the sample, which in turn results in an electrostatic deflection of subsequently incoming ionized metal atoms toward the undercut of the resist. Second, we show how low-energy secondary electrons during the metallization process can cause cross-linking, blisters, and bubbles in the respective resist layer used for defining micro- and nanostructures in an e-beam lithography process. After the metal deposition, the cross-linked resist may lead to significant problems in the lift-off process and causes leftover residues on the device. We provide a troubleshooting guide on how to minimize these effects, which e.g. includes the correct alignment of the e-beam, the avoidance of contaminations in the crucible and, most importantly, the installation of deflector electrodes within the evaporation chamber.
- Is Part Of:
- Journal of physics. Volume 54:Number 22(2021)
- Journal:
- Journal of physics
- Issue:
- Volume 54:Number 22(2021)
- Issue Display:
- Volume 54, Issue 22 (2021)
- Year:
- 2021
- Volume:
- 54
- Issue:
- 22
- Issue Sort Value:
- 2021-0054-0022-0000
- Page Start:
- Page End:
- Publication Date:
- 2021-03-09
- Subjects:
- e-beam evaporation -- microfabrication -- nanofabrication
Physics -- Periodicals
530 - Journal URLs:
- http://ioppublishing.org/ ↗
http://iopscience.iop.org/0022-3727 ↗ - DOI:
- 10.1088/1361-6463/abe89b ↗
- Languages:
- English
- ISSNs:
- 0022-3727
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 15981.xml