Cite
MLA Citation
Hiroki Nakao et al.. “Investigation of High Current Tetracene-TFT Using Surface Nitrided SiO2 Gate Insulator Film.” ECS transactions, vol. 75, 2016, pp. 81–85. http://access.bl.uk/ark:/81055/vdc_100117118277.0x00000e
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Hiroki Nakao et al.. “Investigation of High Current Tetracene-TFT Using Surface Nitrided SiO2 Gate Insulator Film.” ECS transactions, vol. 75, 2016, pp. 81–85. http://access.bl.uk/ark:/81055/vdc_100117118277.0x00000e