Cite
APA Citation
Lang, J., Lim, J., Hellen, J., Nilsson, T. M., Schodt, B., Poder, R., Belov, I., Bakowski, M., & Leisner, P. (2016). (Invited) Reliability Study of RF Power Amplifiers with GaN-on-SiC HEMTs. ECS transactions, 75, 49–59. http://access.bl.uk/ark:/81055/vdc_100117133625.0x000010