Cite
HARVARD Citation
Lang, J. et al. (2016). (Invited) Reliability Study of RF Power Amplifiers with GaN-on-SiC HEMTs. ECS transactions. pp. 49-59. [Online].
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Lang, J. et al. (2016). (Invited) Reliability Study of RF Power Amplifiers with GaN-on-SiC HEMTs. ECS transactions. pp. 49-59. [Online].