Cite
HARVARD Citation
Diaz Llorente, C. et al. (2019). Charge Pumping in Ultrathin SOI Tunnel FETs: Impact of Back-Gate Voltage. ECS transactions. pp. 111-120. [Online].
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Diaz Llorente, C. et al. (2019). Charge Pumping in Ultrathin SOI Tunnel FETs: Impact of Back-Gate Voltage. ECS transactions. pp. 111-120. [Online].