Cite
MLA Citation
Shumao Zhang and Yue Kuo. “(Invited) Temperature Influence on Current Leakage and Hysteresis of Nc-CdSe Embedded Zr-Doped HfO2 High-k Dielectric Nonvolatile Memory.” ECS transactions, vol. 66, 2015, pp. 195–202. http://access.bl.uk/ark:/81055/vdc_100117116764.0x00000d