Cite
HARVARD Citation
Zhang, S. et al. (2015). (Invited) Temperature Influence on Current Leakage and Hysteresis of Nc-CdSe Embedded Zr-Doped HfO2 High-k Dielectric Nonvolatile Memory. ECS transactions. pp. 195-202. [Online].
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Zhang, S. et al. (2015). (Invited) Temperature Influence on Current Leakage and Hysteresis of Nc-CdSe Embedded Zr-Doped HfO2 High-k Dielectric Nonvolatile Memory. ECS transactions. pp. 195-202. [Online].