Cite
HARVARD Citation
Bett, D. et al. (2021). A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamlines. Journal of instrumentation. p. P01005. [Online].
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Bett, D. et al. (2021). A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamlines. Journal of instrumentation. p. P01005. [Online].