A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamlines. (1st January 2021)

Record Type:: Journal Article
Title:: A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamlines. (1st January 2021)
Main Title:: A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamlines
Authors:: Bett, D.R.
Burrows, P.N.
Perry, C.
Ramjiawan, R.
Terunuma, N.
Kubo, K.
Okugi, T.
Abstract:
Is Part Of:: Journal of instrumentation. Volume 16:Number 1(2021)
Journal:: Journal of instrumentation
Issue:: Volume 16:Number 1(2021)
Issue Display:: Volume 16, Issue 1 (2021)
Year:: 2021
Volume:: 16
Issue:: 1
Issue Sort Value:: 2021-0016-0001-0000
Page Start:: P01005
Page End:: P01005
Publication Date:: 2021-01-01
Subjects:: Scientific apparatus and instruments -- Periodicals
502.84
Journal URLs:: http://iopscience.iop.org/1748-0221 ↗
http://ioppublishing.org/ ↗
DOI:: 10.1088/1748-0221/16/01/P01005 ↗
Languages:: English
ISSNs:: 1748-0221
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 15628.xml