Cite
HARVARD Citation
Chen, C. et al. (2016). Fabrication Variability in Multiple Gate MOSFETs: A Bulk FinFET Study. ECS journal of solid state science and technology. pp. P3096-P3100. [Online].
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Chen, C. et al. (2016). Fabrication Variability in Multiple Gate MOSFETs: A Bulk FinFET Study. ECS journal of solid state science and technology. pp. P3096-P3100. [Online].