Cite
MLA Citation
Peter Sjövall et al.. “Analysis of kerogens and model compounds by time-of-flight secondary ion mass spectrometry (TOF-SIMS).” Fuel, vol. 286, 2021, p. . http://access.bl.uk/ark:/81055/vdc_100117400333.0x000060
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Peter Sjövall et al.. “Analysis of kerogens and model compounds by time-of-flight secondary ion mass spectrometry (TOF-SIMS).” Fuel, vol. 286, 2021, p. . http://access.bl.uk/ark:/81055/vdc_100117400333.0x000060