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APA Citation
Kisielowski, C., Specht, P., Yancey, D., Rozeveld, S., Kang, J., McKenna, A., & Barton, D. (n.d.). the Ultimate Detection Limit: Building Electron Diffraction Patterns One Electron at a Time. Microscopy and microanalysis, 26, 2874–2876. http://access.bl.uk/ark:/81055/vdc_100114896731.0x000047