Cite
MLA Citation
Y. Buvat et al.. “Ageing of glass passivated TRIAC devices under thermal and electrical stress.” Microelectronics and reliability, vol. 114, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100116496885.0x000059
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Y. Buvat et al.. “Ageing of glass passivated TRIAC devices under thermal and electrical stress.” Microelectronics and reliability, vol. 114, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100116496885.0x000059