Cite
HARVARD Citation
Buvat, Y. et al. (2020). Ageing of glass passivated TRIAC devices under thermal and electrical stress. Microelectronics and reliability. p. . [Online].
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Buvat, Y. et al. (2020). Ageing of glass passivated TRIAC devices under thermal and electrical stress. Microelectronics and reliability. p. . [Online].