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APA Citation
Nolot, E., Mazel, Y., Barnes, J., Sabbione, C., Navarro, G., Tempez, A., & Legendre, S. (2020). accelerating the development of phase‐change random access memory with in‐fab plasma profiling time‐of‐flight mass spectrometry. Surface and interface analysis, 52, 895–899. http://access.bl.uk/ark:/81055/vdc_100116171978.0x00003b