Cite
MLA Citation
Xiyue Zhang et al.. “A Robust Basis for Grain Identification in Polycrystalline Thin Film Devices Using Cepstrum Transforms of 4D-STEM Diffraction Pattern.” Microscopy and microanalysis, vol. 26, n.d., pp. 1620–1622. http://access.bl.uk/ark:/81055/vdc_100114896563.0x00002e