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APA Citation
Ma, X., Kittikunakorn, N., Sorman, B., Xi, H., Chen, A., Marsh, M., Mongeau, A., Piché, N., Williams, R., & Skomski, D. (n.d.). deep Learning Convolutional Neural Networks for Pharmaceutical Tablet Defect Detection. Microscopy and microanalysis, 26, 1606–1609. http://access.bl.uk/ark:/81055/vdc_100114896468.0x000042