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APA Citation
Engelke, R., Yoo, H., Carr, S., Sung, S. H., Zhang, K., Valdivia, A. M., Tadmor, E., Hovden, R., Kaxiras, E., & Kim, P. (n.d.). imaging of 2-Dimensional Dislocation Networks in Twisted Bilayer Graphene and Beyond. Microscopy and microanalysis, 26, 854–855. http://access.bl.uk/ark:/81055/vdc_100114896398.0x000049