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HARVARD Citation
Saito, S. et al. (2017). Determination of band profiles in GaN films using hard X-ray photoelectron spectroscopy. Japanese journal of applied physics. p. . [Online].
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Saito, S. et al. (2017). Determination of band profiles in GaN films using hard X-ray photoelectron spectroscopy. Japanese journal of applied physics. p. . [Online].