Effects of alloying elements in high reliability copper wire bond material for high temperature applications. (November 2020)
- Record Type:
- Journal Article
- Title:
- Effects of alloying elements in high reliability copper wire bond material for high temperature applications. (November 2020)
- Main Title:
- Effects of alloying elements in high reliability copper wire bond material for high temperature applications
- Authors:
- Eto, M.
Araki, N.
Yamada, T.
Klengel, R.
Klengel, S.
Petzold, M.
Sugiyama, M.
Fujimoto, S. - Abstract:
- Abstract: Recently, a shift from Au bonding wire to Cu bonding wire is expected for automotive application. Palladium coated copper (PCC) wire is strong candidate since it is widely used in LSI packages owing to its high performance and low cost. In order to apply PCC wire to automotive devices, long-term reliability specific to automobiles including stable operation under harsh environment with high temperature and humidity is required. However, pitting corrosion at the wedge bond portion was reported with PCC wire under high temperature storage life (HTSL) test. Depending on the surrounding environment such as mold compound, it is difficult for conventional PCC wire to achieve the target of automotive application. A newly developed PCC wire (EX1R) has thus developed. By using additive element in Cu core, halide induced interface corrosion and also pitting corrosion can be prevented successfully. In this paper, effect of additive element on the corrosion resistance will be discussed. The result shows that additive element forms protective passivation layer on the intermetallic compound (IMC) and Cu surface. Thereby, EX1R improves bond reliability even under severe reliability test condition. Highlights: Effects of alloying elements in copper wire material Performance of bond reliability under high temperature environment Enhancing Cu wire bond reliability using alloying elements
- Is Part Of:
- Microelectronics and reliability. Volume 114(2020)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 114(2020)
- Issue Display:
- Volume 114, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 114
- Issue:
- 2020
- Issue Sort Value:
- 2020-0114-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-11
- Subjects:
- Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2020.113819 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 14844.xml