Cite
HARVARD Citation
Scognamillo, C. et al. (2020). Combined experimental-FEM investigation of electrical ruggedness in double-sided cooled power modules. Microelectronics and reliability. p. . [Online].
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Scognamillo, C. et al. (2020). Combined experimental-FEM investigation of electrical ruggedness in double-sided cooled power modules. Microelectronics and reliability. p. . [Online].