Cite
HARVARD Citation
Susinni, G. et al. (2020). A non-invasive SiC MOSFET Junction temperature estimation method based on the transient light Emission from the intrinsic body diode. Microelectronics and reliability. p. . [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Susinni, G. et al. (2020). A non-invasive SiC MOSFET Junction temperature estimation method based on the transient light Emission from the intrinsic body diode. Microelectronics and reliability. p. . [Online].