Fault diagnosis of cracks in crystalline silicon photovoltaic modules through I-V curve. (November 2020)

• Record Type: Journal Article
• Authors: Ma, Mingyao; Zhang, Zhixiang; Xie, Zhen; Yun, Ping; Zhang, Xing; Li, Fei
• Is Part Of: Microelectronics and reliability. Volume 114(2020)
• Publication Date: 2020-11
• Subjects: Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2020.113848
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: Photovoltaic (PV) cell cracks in wafer-based silicon PV modules are a well-known problem. In order to extract the fault characteristics of the cracked PV modules, we investigate and collect the cracked PV modules in several large PV power plants. The I-V characteristics of the cracked PV modules are tested. The test results show that the I-V curves of the cracked PV modules show a convex function step, and the reason for the I-V characteristics of the cracked PV module is analysed. A method for online diagnosis of PV module crack through I-V curve is proposed. Highlights: Non-uniformity of crack causes inconsistent characteristics of cells. The step of cracked PV module I-V curve shows a convex function feature. I-V curve is derived to detect the step and the step type is determined by the current difference. Online diagnosis of cracks in photovoltaic modules based on I-V curve.