Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning. (November 2020)
- Record Type:
- Journal Article
- Title:
- Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning. (November 2020)
- Main Title:
- Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning
- Authors:
- Chen, J.
Lange, T.
Andjelkovic, M.
Simevski, A.
Krstic, M. - Abstract:
- Abstract: This work introduces an embedded approach for the prediction of Solar Particle Events (SPEs) in space applications by combining the real-time Soft Error Rate (SER) measurement with SRAM-based detector and the offline trained machine learning model. The proposed approach is intended for the self-adaptive fault-tolerant multiprocessing systems employed in space applications. With respect to the state-of-the-art, our solution allows for predicting the SER 1 h in advance and fine-grained hourly tracking of SER variations during SPEs as well as under normal conditions. Therefore, the target system can activate the appropriate mechanisms for radiation hardening before the onset of high radiation levels. Based on the comparison of five different machine learning algorithms trained with the public space flux database, the preliminary results indicate that the best prediction accuracy is achieved with the recurrent neural network (RNN) with long short-term memory (LSTM). Highlights: Embedded approach for the prediction of solar particle events in space application Real-time soft error rate measurement from on-board single event upset monitor Offline trained supervised machine learning model with the historical soft error rate Prediction the soft error rate one hour in advance and fine-grained hourly tracking variations during solar particle events Recurrent neural network with long short-term memory model has the best accuracy
- Is Part Of:
- Microelectronics and reliability. Volume 114(2020)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 114(2020)
- Issue Display:
- Volume 114, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 114
- Issue:
- 2020
- Issue Sort Value:
- 2020-0114-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-11
- Subjects:
- Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2020.113799 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 14839.xml