Cite
HARVARD Citation
Liao, X. et al. (2020). Fault protection for a SiC MOSFET based on gate voltage subjected to short circuit type II. Microelectronics and reliability. p. . [Online].
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Liao, X. et al. (2020). Fault protection for a SiC MOSFET based on gate voltage subjected to short circuit type II. Microelectronics and reliability. p. . [Online].