RETRACTED: A Review on Modeling and Analysis of Accelerated Degradation Data for Reliability Assessment. (April 2020)
- Record Type:
- Journal Article
- Title:
- RETRACTED: A Review on Modeling and Analysis of Accelerated Degradation Data for Reliability Assessment. (April 2020)
- Main Title:
- RETRACTED: A Review on Modeling and Analysis of Accelerated Degradation Data for Reliability Assessment
- Authors:
- Pang, Zhenan
Si, XiaoSheng
Hu, Changhua
Zhang, Jianxun
Pei, Hong - Abstract:
- Is Part Of:
- Microelectronics and reliability. Volume 107(2020)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 107(2020)
- Issue Display:
- Volume 107, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 107
- Issue:
- 2020
- Issue Sort Value:
- 2020-0107-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-04
- Subjects:
- Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2020.113602 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 14777.xml