Comparing analytical and Monte-Carlo-based simulation methods for logic gates SET sensitivity evaluation. (November 2020)

• Record Type: Journal Article
• Authors: Schvittz, R.B.; Aguiar, Y.Q.; Wrobel, F.; Autran, J.-L.; Rosa, L.S.; Butzen, P.F.
• Is Part Of: Microelectronics and reliability. Volume 114(2020)
• Publication Date: 2020-11
• Subjects: Electronic apparatus and appliances -- Reliability -- Periodicals; Miniature electronic equipment -- Periodicals; Appareils électroniques -- Fiabilité -- Périodiques; Équipement électronique miniaturisé -- Périodiques; Electronic apparatus and appliances -- Reliability; Miniature electronic equipment; Periodicals; 621.3815
• DOI: 10.1016/j.microrel.2020.113871
• Languages: English
• ISSNs: 0026-2714

Abstract

Abstract: This paper presents a discussion related to two different methods used to evaluate logic gate susceptibility considering Single Event Transient faults at the layout level. These methods can be adopted into radiation-hardening-driven optimizations to improve the overall reliability of circuits. The results show that the simulation approach presents a higher accuracy by considering charge-sharing effects. At the same time, the analytical method can provide similar results in a faster manner.