Cite
HARVARD Citation
Xi, K. et al. (2020). Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory devices. Microelectronics and reliability. p. . [Online].
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Xi, K. et al. (2020). Impact of electrical stress on total ionizing dose effects on graphene nano-disc non-volatile memory devices. Microelectronics and reliability. p. . [Online].