Cite
MLA Citation
J. Van de Casteele et al.. “0.5 μm GaN RF power bar technology space evaluation.” Microelectronics and reliability, vol. 114, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100114049632.0x00005a
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J. Van de Casteele et al.. “0.5 μm GaN RF power bar technology space evaluation.” Microelectronics and reliability, vol. 114, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100114049632.0x00005a