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HARVARD Citation
Van de Casteele, J. et al. (2020). 0.5 μm GaN RF power bar technology space evaluation. Microelectronics and reliability. p. . [Online].
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Van de Casteele, J. et al. (2020). 0.5 μm GaN RF power bar technology space evaluation. Microelectronics and reliability. p. . [Online].