Influence of contact resistance on the electrical characteristics of organic static induction transistors. (27th August 2019)
- Record Type:
- Journal Article
- Title:
- Influence of contact resistance on the electrical characteristics of organic static induction transistors. (27th August 2019)
- Main Title:
- Influence of contact resistance on the electrical characteristics of organic static induction transistors
- Authors:
- Zhang, Yong
Yang, Shengyi
Jiang, Yurong
Zou, Bingsuo - Abstract:
- Abstract: The influencing factors on the current–voltage ( I – V ) characteristics of organic static induction transistors (OSITs) are complicated and usually the underneath physical mechanism depends on many parameters. In this paper, firstly we come up with a typical OSIT model and summarize its theoretical equations to the I – V curves of pentacene-based OSIT ITO(Source)/Pentacene/ Al(Gate)/Pentacene/Au(Drain) under both negative drain–source voltage and gate voltage ( V G ), and the influence of contact resistance on OSITs is investigated. Our simulation showed that the injection barriers, the depletion layer and the gate controlling reduce when OSIT approaches the space-charge-limited current mode by decreasing the negative V G, which confirms our previous supposal that the contact resistance at the interfaces of Al inter-gate electrode and at the two injection electrodes reduces after keeping the device for a long-enough time. Also, our simulating equations can be applied to other organic based OSITs under positive both V DS and V G .
- Is Part Of:
- Semiconductor science and technology. Volume 34:Number 9(2019)
- Journal:
- Semiconductor science and technology
- Issue:
- Volume 34:Number 9(2019)
- Issue Display:
- Volume 34, Issue 9 (2019)
- Year:
- 2019
- Volume:
- 34
- Issue:
- 9
- Issue Sort Value:
- 2019-0034-0009-0000
- Page Start:
- Page End:
- Publication Date:
- 2019-08-27
- Subjects:
- contact resistance -- organic static induction transistor (OSIT) -- pentacene -- negative drain–source voltage -- device configuration
Semiconductors -- Periodicals
621.38152 - Journal URLs:
- http://iopscience.iop.org/0268-1242/1 ↗
http://ioppublishing.org/ ↗ - DOI:
- 10.1088/1361-6641/ab3818 ↗
- Languages:
- English
- ISSNs:
- 0268-1242
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - BLDSS-3PM
British Library STI - ELD Digital store - Ingest File:
- 14721.xml