An Empirical Algorithm for Power Analysis in Deep Submicron Electronic Designs. Issue 2 (2002)

• Record Type: Journal Article
• Authors: Huang, May; Kwok, Raymond; Chan, Shu-park
• Is Part Of: VLSI design. Volume 14:Issue 2(2002)
• Page Start: 219
• Page End: 227
• Publication Date: 2002
• Subjects: Integrated circuits -- Very large scale integration -- Periodicals; 621.395
• DOI: 10.1080/10655140290010123
• Languages: English
• ISSNs: 1065-514X

Abstract

Abstract : An empirical algorithm applied to logic level power analysis in deep submicron VLSI designs is introduced in the paper. The method explores a static analysis strategy using unit functions to represent signal transitions. It can be extended to the use of a Register Transfer Level (RTL) power analysis after RTL codes are translated to Boolean equations. A new method for representing state-dependent power models is also introduced in the paper to reduce the complexity of power modeling and to improve the performance of power analysis. The modeling method supports not only the empirical power analysis, but also general simulation-based power analysis methods.