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APA Citation
Rickard, W. D., Reddy, S. M., Saxey, D. W., Fougerouse, D., Timms, N. E., Daly, L., Peterman, E., Cavosie, A. J., & Jourdan, F. (2020). novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows. Microscopy and microanalysis, 26, 750–757. http://access.bl.uk/ark:/81055/vdc_100113094253.0x000026