In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM. Issue 6 (30th March 2020)

Record Type:: Journal Article
Title:: In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM. Issue 6 (30th March 2020)
Main Title:: In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM
Authors:: Brazil, Owen
de Silva, Johann P.
Chowdhury, Mithun
Yoon, Heedong
McKenna, Gregory B.
Oliver, Warren C.
Kilpatrick, Jason
Pethica, John B.
Cross, Graham L.W.
Abstract:
Is Part Of:: Journal of materials research. Volume 35:Issue 6(2020)
Journal:: Journal of materials research
Issue:: Volume 35:Issue 6(2020)
Issue Display:: Volume 35, Issue 6 (2020)
Year:: 2020
Volume:: 35
Issue:: 6
Issue Sort Value:: 2020-0035-0006-0000
Page Start:: 654
Page End:: 654
Publication Date:: 2020-03-30
Subjects:: Materials -- Research -- Periodicals
620.1105
Journal URLs:: https://www.springer.com/journal/43578 ↗
http://journals.cambridge.org/action/displayJournal?jid=JMR ↗
http://link.springer.com/ ↗
http://www.mrs.org/ ↗
DOI:: 10.1557/jmr.2020.67 ↗
Languages:: English
ISSNs:: 0884-2914
Deposit Type:: Legaldeposit
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store
Ingest File:: 14635.xml