In situ measurement of bulk modulus and yield response of glassy thin films via confined layer compression - ERRATUM. Issue 6 (30th March 2020) - Brazil, Owen; de Silva, Johann P.; Chowdhury, Mithun; Yoon, Heedong; McKenna, Gregory B.; Oliver, Warren C.; Kilpatrick, Jason; Pethica, John B.; Cross, Graham L.W.