Cite
HARVARD Citation
Goh, Y. et al. (2020). Contamination of TEM Holders Quantified and Mitigated With the Open-Hardware, High-Vacuum Bakeout System. Microscopy and microanalysis. pp. 906-912. [Online].
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Goh, Y. et al. (2020). Contamination of TEM Holders Quantified and Mitigated With the Open-Hardware, High-Vacuum Bakeout System. Microscopy and microanalysis. pp. 906-912. [Online].