Printed wire assembly HASS profile development based on HALT. (July 2020)
- Record Type:
- Journal Article
- Title:
- Printed wire assembly HASS profile development based on HALT. (July 2020)
- Main Title:
- Printed wire assembly HASS profile development based on HALT
- Authors:
- Awad, Mahmoud I.
- Abstract:
- Abstract: Highly accelerated life testing (HALT) is a test method used to expose design weaknesses at early stages of product development cycle by testing products under elevated stresses. Similarly, highly accelerated stress screening (HASS) is a widely accepted production test derived from HALT used to detect manufacturing defects jeopardizing product reliability. Despite wide usage of HASS, there is no clear way of deriving HASS from HALT for printed wire assemblies (PWA). Practitioners develop HASS by experimenting with 50% of HALT shock loads and 80% of thermal limits then reduce shock level until PWA pass at least twenty profiles. Such process is cost and time consuming. In this article, a more efficient and safe method to plan HASS is proposed and demonstrated using a real life case study. Successful implementation of the proposed method will enable practitioners to predict and determine how many profiles a PWA can survive under different loading conditions, which will reduce testing, time and cost. The proposed method is derived from the physics of failure and statistical modeling of solder joint strain range. The physical basis of the model is provided by Minor's rule of damage accumulation and Coffin-Manson and Basquin total strain model. Strain amplitude of solder joint is modeled using a power model in terms of vibration load and temperature. The proposed method is demonstrated using a gauge acquisition PWA used for oil & gas equipment. Results of case studyAbstract: Highly accelerated life testing (HALT) is a test method used to expose design weaknesses at early stages of product development cycle by testing products under elevated stresses. Similarly, highly accelerated stress screening (HASS) is a widely accepted production test derived from HALT used to detect manufacturing defects jeopardizing product reliability. Despite wide usage of HASS, there is no clear way of deriving HASS from HALT for printed wire assemblies (PWA). Practitioners develop HASS by experimenting with 50% of HALT shock loads and 80% of thermal limits then reduce shock level until PWA pass at least twenty profiles. Such process is cost and time consuming. In this article, a more efficient and safe method to plan HASS is proposed and demonstrated using a real life case study. Successful implementation of the proposed method will enable practitioners to predict and determine how many profiles a PWA can survive under different loading conditions, which will reduce testing, time and cost. The proposed method is derived from the physics of failure and statistical modeling of solder joint strain range. The physical basis of the model is provided by Minor's rule of damage accumulation and Coffin-Manson and Basquin total strain model. Strain amplitude of solder joint is modeled using a power model in terms of vibration load and temperature. The proposed method is demonstrated using a gauge acquisition PWA used for oil & gas equipment. Results of case study suggest that proposed method is able to predict number of HASS profiles to failure with reasonable 3% prediction error. Highlights: Despite wide usage of HASS, there is no clear way of deriving HASS from HALT for printed wire assemblies (PWA). In this article, a more efficient and safe method to plan HASS is proposed and demonstrated using a real life case study. Such process is cost and time consuming. In this article, a more efficient and safe method to plan HASS is proposed and demonstrated using a real life case study. Successful implementation of the proposed method will enable practioners to predict and determine how many profiles a PWA can survive under different loading conditions, which will reduce testing, time and cost. The method utilizes SJ physics of failure along with Miner''s cumulative damage rule to determine the appropriate HASS vibration level. … (more)
- Is Part Of:
- Microelectronics and reliability. Volume 110(2020)
- Journal:
- Microelectronics and reliability
- Issue:
- Volume 110(2020)
- Issue Display:
- Volume 110, Issue 2020 (2020)
- Year:
- 2020
- Volume:
- 110
- Issue:
- 2020
- Issue Sort Value:
- 2020-0110-2020-0000
- Page Start:
- Page End:
- Publication Date:
- 2020-07
- Subjects:
- Highly accelerated life testing -- Highly accelerated stress screening -- Printed wire assembly
Electronic apparatus and appliances -- Reliability -- Periodicals
Miniature electronic equipment -- Periodicals
Appareils électroniques -- Fiabilité -- Périodiques
Équipement électronique miniaturisé -- Périodiques
Electronic apparatus and appliances -- Reliability
Miniature electronic equipment
Periodicals
621.3815 - Journal URLs:
- http://www.sciencedirect.com/science/journal/00262714 ↗
http://www.elsevier.com/journals ↗
http://www.elsevier.com/homepage/elecserv.htt ↗ - DOI:
- 10.1016/j.microrel.2020.113702 ↗
- Languages:
- English
- ISSNs:
- 0026-2714
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 5758.979000
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 14591.xml