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APA Citation
Aldana, S., Pérez, E., Jiménez-Molinos, F., Wenger, C., & Roldán, J. B. (2020). kinetic Monte Carlo analysis of data retention in Al:HfO2-based resistive random access memories. Semiconductor science and technology, 35, . http://access.bl.uk/ark:/81055/vdc_100110449476.0x000021