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Aldana, S. et al. (2020). Kinetic Monte Carlo analysis of data retention in Al:HfO2-based resistive random access memories. Semiconductor science and technology. p. . [Online].
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Aldana, S. et al. (2020). Kinetic Monte Carlo analysis of data retention in Al:HfO2-based resistive random access memories. Semiconductor science and technology. p. . [Online].