Cite
HARVARD Citation
Chao, W. et al. (n.d.). P‐6.9: High‐reliability a‐Si:H TFT with Repressing Photo‐degradation on G8.6 LCDs. Digest of technical papers. pp. 779-780. [Online].
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Chao, W. et al. (n.d.). P‐6.9: High‐reliability a‐Si:H TFT with Repressing Photo‐degradation on G8.6 LCDs. Digest of technical papers. pp. 779-780. [Online].