Cite

MLA Citation

    Qiong-hua Mo et al.. “48.3: Stress Model Simulation of TFT reliability for G8.6 large‐size TFT‐LCDs.” Digest of technical papers, vol. 50, n.d., pp. 549–551. http://access.bl.uk/ark:/81055/vdc_100092801335.0x00004f
  
Back to record