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HARVARD Citation
Mo, Q. et al. (n.d.). 48.3: Stress Model Simulation of TFT reliability for G8.6 large‐size TFT‐LCDs. Digest of technical papers. pp. 549-551. [Online].
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Mo, Q. et al. (n.d.). 48.3: Stress Model Simulation of TFT reliability for G8.6 large‐size TFT‐LCDs. Digest of technical papers. pp. 549-551. [Online].