Cite
MLA Citation
Jingjing Shao et al.. “Abnormal threshold voltage shift caused by trapped holes under hot-carrier stress in a-IGZO TFTs.” Journal of physics, vol. 53, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100108264397.0x000063
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Jingjing Shao et al.. “Abnormal threshold voltage shift caused by trapped holes under hot-carrier stress in a-IGZO TFTs.” Journal of physics, vol. 53, 2020, p. . http://access.bl.uk/ark:/81055/vdc_100108264397.0x000063